Testing and Reliability of Power Electronics

• Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
  Article
  

  Stella, Fausto; Olufisayo, Olanrewaju; Zineng, Yang; Alberto, Castellazzi; Pellegrino, Gianmario
  MICROELECTRONICS RELIABILITY
  Elsevier
  Vol.88-90 pp.6 (pp.615-619) ISSN:0026-2714 DOI:10.1016/j.microrel.2018.07.072

• Assessing Test Procedure Effectiveness for Power Devices
  Proceeding
  

  Piumatti, Davide; Sonza Reorda, M.
  In: 33th IEEE Conference on Design of Circuits and Integrated Systems
  IEEE DCIS 2019 (FRANCIA)
  33th IEEE Conference on Design of Circuits and Integrated Systems (Lione, Francia) November 14-16 2018
  Vol.2018 pp.6 (pp.1-6) ISBN:9781728101712 DOI:10.1109/DCIS.2018.8681495

• On-line Junction Temperature Estimation of SiC Power MOSFETs through On-state Voltage Mapping
  Article
  

  Stella, Fausto; Pellegrino, Gianmario; Armando, ERIC GIACOMO; Dapra', Davide
  IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
  IEEE
  Vol.54 pp.10 (pp.3453-3462) ISSN:0093-9994 DOI:10.1109/TIA.2018.2812710

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