Testing and Reliability of Power Electronics
2018-
Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Article
Stella, Fausto; Olufisayo, Olanrewaju; Zineng, Yang; Alberto, Castellazzi; Pellegrino, Gianmario
MICROELECTRONICS RELIABILITY
Elsevier
Vol.88-90 pp.6 (pp.615-619) ISSN:0026-2714 DOI:10.1016/j.microrel.2018.07.072 -
Assessing Test Procedure Effectiveness for Power Devices
Proceeding
Piumatti, Davide; Sonza Reorda, M.
In: 33th IEEE Conference on Design of Circuits and Integrated Systems
IEEE DCIS 2019 (FRANCIA)
33th IEEE Conference on Design of Circuits and Integrated Systems (Lione, Francia) November 14-16 2018
Vol.2018 pp.6 (pp.1-6) ISBN:9781728101712 DOI:10.1109/DCIS.2018.8681495 -
On-line Junction Temperature Estimation of SiC Power MOSFETs through On-state Voltage Mapping
Article
Stella, Fausto; Pellegrino, Gianmario; Armando, ERIC GIACOMO; Dapra', Davide
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IEEE
Vol.54 pp.10 (pp.3453-3462) ISSN:0093-9994 DOI:10.1109/TIA.2018.2812710
Total: 3